Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials

1,2,3Gu, L.,2,4Wang, N.,1,2,3Tang, X.,2,3,5,6Changela, H.G.
Scanning 2020, 8406917 Link to Article [DOI: 10.1155/2020/8406917]
1Electron Microscopy Laboratory, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, China
2Key Laboratory of Earth and Planetary Physics, Institute of Geology and Geophysics, Chinese Academy of Sciences, Beijing, China
3Innovation Academy for Earth Science, Chinese Academy of Sciences, Beijing, 10029, China
4University of Chinese Academy of Sciences, Beijing, China
5Qian Xuesen Laboratory of Space Technology, Chinese Academy of Space Technology, Beijing, China
6Department of Earth and Planetary Science, University of New Mexico, New Mexico, United States

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